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Changing the PLM Landscape: PTC’s Acquisition of MKS
Posted on July 18, 2011 | No CommentsA few weeks ago, while I was in Boston, I sat down with a couple old friends for lunch. We like to talk about what’s happening in the industry and... -
Identifying Form, Fit and Function Artifacts in the Product Record
Posted on September 13, 2010 | No CommentsThese two key characteristics are important when you start thinking about how each of these artifacts are being authored as that will directly affect the availability of any information embedded in the files or data it creates. Furthermore, it's important to think about how each of these artifacts are being managed as that will directly affect the propagation of engineering and design change into other dependent artifacts.






